ASTM E2382-2004 扫描隧道显微镜学和原子力显微镜学中扫描器和与触点相关物品的指南

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【英文标准名称】:GuidetoScannerandTipRelatedArtifactsinScanningTunnelingMicroscopyandAtomicForceMicroscopy
【原文标准名称】:扫描隧道显微镜学和原子力显微镜学中扫描器和与触点相关物品的指南
【标准号】:ASTME2382-2004
【标准状态】:现行
【国别】:
【发布日期】:2004
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:E42.14
【标准类型】:(Guide)
【标准水平】:()
【中文主题词】:
【英文主题词】:Abbeoffseterror;creep;dilation;hysteresis;nonlinearity;probe-samplemixing;AFM;STM;tipshape;proximalprobe;geometricmixing;imagereconstruction
【摘要】:1.1Allmicroscopesaresubjecttoartifacts.Thepurposeofthisdocumentistoprovideadescriptionofcommonlyobservedartifactsinscanningtunnelingmicroscopy(STM)andatomicforcemicroscopy(AFM)relatingtoprobemotionandgeometricconsiderationsofthetipandsurfaceinteraction,provideliteraturereferencesofexamplesand,wherepossible,toofferaninterpretationastothesourceoftheartifact.Becausethescannedprobemicroscopyfieldisaburgeoningone,thisdocumentisnotmeanttobecomprehensivebutrathertoserveasaguidetopracticingmicroscopistsastopossiblepitfallsonemayexpect.Theabilitytorecognizeartifactsshouldassistinreliableevaluationofinstrumentoperationandinreportingofdata.1.2Alimitedsetoftermswillbedefinedhere.Afulldescriptionofterminologyrelatingtothedescription,operation,andcalibrationofSTMandAFMinstrumentsisbeyondthescopeofthisdocument.
【中国标准分类号】:N32
【国际标准分类号】:17_040_20
【页数】:20P.;A4
【正文语种】: